User:Karlena L. Brown/Notebook/PVOH Research/2012/09/28
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==X-Ray Diffraction Instructions== | ==X-Ray Diffraction Instructions== | ||
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| + | '''Sample Preparation''' | ||
| + | * Clean off the low signal background sample holder with a Kimwipe and acetone | ||
| + | * Using a spatula, scoop and place small amount of finely ground clay sample into sample holder compartment | ||
| + | * Using a spatula, level off the clay surface in the compartment making an even smooth level plane | ||
| + | * Wipe the outsides of the compartment of the low signal background sample holder with Kimwipe and acetone again | ||
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| + | '''Instrument Programming and Operation''' | ||
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| + | * Turn on chiller machine | ||
| + | * Power up X-Ray Diffractometer | ||
| + | * Set geiger counter 0.1 as a value | ||
| + | * Check radiation output | ||
| + | * Open X-Ray Diffractometer instrument door and set sample in sample counter | ||
| + | * Record sample compartment number in the machine and close the X-ray door | ||
| + | * Turn on computer, find instrument password, and open '''STANDARD MEASUREMENT PROGRAM''' | ||
| + | * Use the command window to click machine on to connect to the computer | ||
| + | * Change the file name under Data window to create new folder → '''CHEM 581''' → '''MKM''' | ||
| + | * Create name for sample run under new folder '''MKM''' → '''NaMT''' | ||
| + | * Finally save all information and let the sample run begin and continue for 30 minutes | ||
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| + | '''X-Ray Diffraction will be run on the following clays: 50% CEC NaMT, 100% CEC NaMT, and the α-Fe<sub>3</sub>O<sub>4</sub>''' | ||
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| + | '''NOTES''' | ||
| + | # Particle sizes of clay must always be small and finely ground | ||
| + | # Peaks in clay appear at very low deflection angles (2.5°) | ||
| + | # NEVER turn off the X-ray coolant in the chiller machine: DAMAGES X-RAY TOOL!!! | ||
| + | # NEVER rotate powders because sample can fall out!!! | ||
| + | # All sample run should be run from angles (2 - 40°) at a scanning speed no greater than 1.0 | ||
==Na<sup>+</sup> and Cu<sup>2+</sup> Ion Calculations in 2000ppm SO<sub>4</sub><sup>2-</sup> Solutions== | ==Na<sup>+</sup> and Cu<sup>2+</sup> Ion Calculations in 2000ppm SO<sub>4</sub><sup>2-</sup> Solutions== | ||
Revision as of 17:18, 22 October 2012
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OBJECTIVES
X-Ray Diffraction InstructionsSample Preparation
Instrument Programming and Operation
X-Ray Diffraction will be run on the following clays: 50% CEC NaMT, 100% CEC NaMT, and the α-Fe3O4 NOTES
Na+ and Cu2+ Ion Calculations in 2000ppm SO42- Solutions
MW Na2SO4: 142.04 g/mol MW Na+: 22.99 g/mol Mass Na+: 0.00150 g Na2SO4 × (1 mol Na2SO4/142.04 g Na2SO4) × (2 mol Na+/1 mol Na2SO4) × (22.99 g Na+/1 mol Na+) = 4.856 × 10-4 g Na+ Actual concentration of Na+ in 2020 ppm SO4-2 solution: (4.856 × 10-4 g Na+)/0.5 L × 106 = 971 ppm
MW CuSO4·5H2O: 249.69 g/mol MW Cu+2: 63.55 g/mol 0.00252 g CuSO4·5H2O × (1 mol CuSO4·5H2O/249.68 g CuSO4·5H2O) × (1 mol Cu+2/1 mol CuSO4·5H2O) × (63.55 g Cu+2/1 mol CuSO4·5H2O) = 6.41 × 10-4 g Cu+2 Actual concentration of Cu+2 in 2020 ppm SO4-2 solution: (6.41 × 10-4 g Cu+2)/0.5 L × 106 = 1283 ppm Cu+2 Na+ and Cu2+ Ion Calculations in 20ppm SO42- SolutionsActual concentration of Na+ in 20 ppm SO4-2 solution: Actual concentration of Na+ in 2020 ppm SO4-2 solution: (4.856 × 10-4 g Na+)/0.5 L × 106 = 971 ppm (971 ppm)(0.00495 L) = (M2)(0.5 L) M2 = 9.61 ppm Na+ Actual concentration of Cu+2 in 20 ppm SO4-2 solution: Actual concentration of Cu+2 in 2020 ppm SO4-2 solution: (6.41 × 10-4 g Cu+2)/0.5 L × 106 = 1283 ppm Cu+2 (1283 ppm)(5.16 mL) = (M2)(0.5 L) M2 = 13.2 ppm Cu+2
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