User:Sim Huay Ping/Notebook/CBE/08/150/2008/09/11: Difference between revisions
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(AFM: www.herzan.com) | (AFM: www.herzan.com) | ||
As a rough guide... | |||
Scan size: 6.00 um | |||
X Offset: -6.73 um | |||
Y Offset: 5.57 um | |||
Set Point: 654.68 mV | |||
Scan Points: 512 | |||
Scan Lines: 512 | |||
To zoom out... | |||
Scan size: 30 um | |||
Scan Points: 128 | |||
Scan Lines: 128 | |||
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Revision as of 03:31, 9 December 2008
 Project name
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<html><img src="/images/9/94/Report.png" border="0" /></html> Main project page <html><img src="/images/c/c3/Resultset_previous.png" border="0" /></html>Previous entry<html> </html>Next entry<html><img src="/images/5/5c/Resultset_next.png" border="0" /></html> |
Atomic Force Microscope1. Initiate the software (MFP-3D-icon) 2. Insert cantilever 3. Align light source using an infrared card. Adjust the sum and detection meter 4. Auto tune 5. Load Sample 6. Scan 7. Save Results (AFM: www.herzan.com) As a rough guide... Scan size: 6.00 um X Offset: -6.73 um Y Offset: 5.57 um Set Point: 654.68 mV Scan Points: 512 Scan Lines: 512 To zoom out... Scan size: 30 um Scan Points: 128 Scan Lines: 128
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