Paul M Gruenbacher (Talk | contribs)
(New page: 750px <div style="padding: 10px; color: #ffffff; background-color: #000; width: 730px"> <center> [[OhioMod2013 | <font face="trebuchet ms" style="color:#fff...)
Next diff →
Revision as of 20:42, 23 June 2013
Atomic Force Microscopy
Atomic Force Microscopy (AFM) uses a cantilever with a sharp probe to scan the surface of a sample. When in contact to the surface interaction, the probe imposes bending to the cantilver, which can be measured using a laser beam that is deflected off of the cantilever.
One mode of hte AFM is the intermittent contact mode in which the cantilever is oscillated in a particular resonance frequency. When the probe is in close contact with the sample, the amplitude of the resonance changes and can be measured. This method is what we used due to its ability to measure weakly adhered nanoparticles. Eventually a topographic image can be generated of the specimen. Keep in mind that the lateral dimensions of the particle are influenced by the shape of the probe, but hte height measurement can be well coressponded to the diameter size.